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X-Ray Inspection Systems

Packed Product Inspection — TDI High Resolution

Time Delay Integration (TDI) imaging collects the signal over eight detector lines instead of one, so the system gathers far more information from each pack. That extra signal is what allows either a finer detection limit at normal line speed, or the same detection limit at a higher speed and lower tube power. It is the model to specify when the standard range is close to its limit.

VXD-C4016-T280
Packed Product Inspection — TDI High Resolution packaging equipment configuration

Key features

  • 0.28 mm high-resolution eight-line TDI detector
  • Holds accuracy at elevated line speeds or reduced tube power
  • AI analysis of contaminant characteristics for low-density and very small objects
  • Guided product-learning routine for adding new SKUs
  • Wi-Fi and 4G connectivity for remote technical support
  • Detachable conveyor for direct wash-down

Typical applications

  • High-speed snack and confectionery lines
  • Thin retail packs
  • Products with low-density contaminant risk

What it detects

  • Metal (ferrous, non-ferrous, stainless)
  • Glass
  • Ceramic
  • Hard plastic and resin
  • Bone and shell
  • Stone

Technical Data

Specifications

US customary units are shown first. Final configuration is confirmed with your product samples and line data during engineering review.

Model
VXD-C4016-T280
Detector resolution
0.28 mm TDI
X-ray source
150 W / 210 W / 350 W
Conveyor speed
16–197 ft/min (5–60 m/min)
Max product weight
22 lb (10 kg)
Aperture (W × H)
15.7 × 6.3 in (400 × 160 mm)
Operating system
Server-grade Linux
HMI
17 in touch screen
Power supply
220 VAC, 50–60 Hz
Environment
32–113 °F (0–45 °C), 30–85% RH, non-condensing
Protection
IP66 conveyor, IP54 remaining assemblies
Construction
304 stainless steel, mirror / sandblasted finish

Is the packed product inspection — tdi high resolution right for your product?

Share your product, pack format, line speed and the defects you need to catch. Pure will confirm the model and sensitivity with sample testing.